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| Network Statistics | |
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IP Packet Generation: Statistical Models for TCP Start Times Based on
Connection-Rate Superposition
William S. Cleveland, Dong Lin, and Don X. Sun |
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Internet Traffic Data
William S. Cleveland and Don X. Sun |
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Time-varying Network Tomography:
Router Link Data Jin Cao, Drew Davis, Scott Vander Wiel, Bin Yu |
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A Scalable Method for Estimating Network Traffic Matrices from Link
Counts Jin Cao, Scott Vander Wiel, Bin Yu, Zhengyuan Zhu |
| Semiconductor Manufacturing | |
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Statistics in Advanced Manufacturing V. N. Nair, M. H. Hansen, and Jan Shi |
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Process Improvement Through the Analysis of Spatially Clustered
Defects on Wafer Maps M. H. Hansen, V. N. Nair, and D. Friedman |
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Process and Productivity Improvement in
Semiconductor Manufacturing Mark H. Hansen and Vijayan Nair |
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Model-free estimation of some yield metrics in
integrated circuit fabrication. D. Friedman, M. H. Hansen, V. Nair and D. James |
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Model-Free Estimation of Defect Clustering in
Integrated Circuit Fabrication (Revision of above) David Friedman, Mark H. Hansen, Vijay Nair and David James |
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Monitoring wafer map data from integrated circuit
fabrication processes for spatially clustered defects. M. H. Hansen, D. Friedman and V. Nair |
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A Computing Environment for Spatial Data Analysis in
the Microelectronics Industry Mark H. Hansen and David James |
| Process Control | |
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Optimal Discrete Adjustments for Short Production
Runs Scott Vander Wiel |
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A Discussion of "All or None" Inspection
Policies Scott Vander Wiel, Stephen Vardeman |
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Monitoring Processes that Wander Using Integrated
Moving Average Models Scott Vander Wiel |
| Fraud Detection | |
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Detecting Fraud in the Real World Michael H. Cahill, Diane Lambert, José C. Pinheiro, and Don X. Sun |
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Incremental Quantile Estimation for Massive
Tracking Fei Chen, Diane Lambert, and José C. Pinheiro |
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Reducing Transaction Databases, Without Lagging
Behind the Data or Losing Information Fei Chen, Diane Lambert, José C. Pinheiro, and Don X. Sun |
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Updating Timing Profiles for Millions of Customers in
Real-Time Diane Lambert, José C. Pinheiro, and Don X. Sun |
| Industrial Statistics | |
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Snapshot:A Plot Showing Progress Through a Device
Development Laboratory Diane Lambert, James M. Landwehr and Ming-Jen Shyu |
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Assessing Software Designs using Capture-Recapture
Methods Scott Vander Wiel and Lawrence Votta |
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Methods for Assessing Distributional Assumptions in
One and Two Sample Problems. Vijayan N. Nair and Anne E. Freeny |
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Planarization by Chemical-Mechanical Polishing: A
Rate and Uniformity Study. Anne E. Freeny and Warren Y.-C. Lai |
| Pattern Recognition | |
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Identifying Word Correspondences in Parallel
Text William A. Gale, Kenneth W. Church |
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A Program for Aligning Sentences in Bilingual
Corpora William A. Gale, Kenneth W. Church |
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Handwritten Digit Recognition via Deformable
Prototypes Trevor Hastie and Robert Tibshirani |
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A statistical approach to automatic speech
recognition using the atomic speech units constructed from
overlapping articulatory features Li Deng and Don X. Sun |
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Hidden Markov models with Non-stationary states for
speech recognition Don X. Sun and Li Deng |
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Analysis of Acoustic-Phonetic Variations in Fluent
Speech Using TIMIT Don X. Sun and Li Deng |
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Production Models as a Structural Basis for
Automatic Speech Recognition Don X. Sun |